From smartphones to laptops, we use a variety of devices every day that rely on integrated circuits (ICs), or chips, to function. These chips are made up of thousands of transistors and interconnects, ...

An innovative measurement technique is providing new insights on electromigration, a leading cause of premature death of microcircuits. Until recently, this phenomenon, which causes fatal shorts and ...

Congratulations to alumnus Bryan Root (ElEngr’84), who was recently elevated to Institute of Electrical and Electronics Engineers Fellow for leadership in improving semiconductor reliability test ...

The shift towards the 28nm node and beyond has put the spotlight back on the interconnect in semiconductor manufacturing. In chip scaling, the big problem in the interconnect is resistance-capacitance ...

Keithley Instruments (Germering, Germany) has released a free tutorial CD on reliability testing for semiconductor test engineers. The CD entitled “Understanding Measurements: Essential Reliability ...

Environmental and qualification testing play a critical role in this process. As device geometries shrink and packaging technologies become more complex, environmental stress testing provides a ...