Nobody wants chips to fail in the field, but at 65 nanometers and below, sudden failure becomes a real threat. Among the most likely causes is electromigration, a problem that's affected ICs since the ...
An innovative measurement technique is providing new insights on electromigration, a leading cause of premature death of microcircuits. Until recently, this phenomenon, which causes fatal shorts and ...
“Due to the resistance of metal wires in power grid network, voltage drop noise occurs in the form of IR drop which may change the output logic of underlying circuits and may affect the reliability ...
From smartphones to laptops, we use a variety of devices every day that rely on integrated circuits (ICs), or chips, to function. These chips are made up of thousands of transistors and interconnects, ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results