Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

In addition to surface and subsurface defects, residual stress represents a concern. Over time, these stress points, ...

A new 3D electrical imaging method shows how passivation reduces defects in perovskite solar cells, clarifying charge transport and stability limits.

Defect states refer to electronic energy levels that arise from imperfections or irregularities in the crystal structure of materials, particularly in semiconductors and insulators. These ...

The concept of zero defect manufacturing has been around for decades, arising first in the aerospace and defense industry. Since then, this manufacturing approach has been adopted by the automotive ...