Increased integration with nanometer processes is resulting in some devices that are using hundreds of small memory blocks distributed throughout the design. Memory BIST can be used to apply standard ...
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In this paper, low power Built-In-Self-Test (BIST) is implemented for 32 bit Vedic multiplier. This paper is to reduce power dissipation in BIST with increased fault coverage. Various methods of ...
The persistent growth of mobile computing is driving an increasing need to manage power consumption within semiconductor devices. This has significant implications on the design and test of these ...
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Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...
WILSONVILLE, Ore. and SAN JOSE, Calif. -- August 19, 2009 – Mentor Graphics Corporation (NASDAQ: MENT) and LogicVision, Inc. (NASDAQ: LGVN) today announced that LogicVision stockholders have voted ...
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