Atomic Force Microscopy (AFM) is a type of high-resolution scanning probe microscopy that allows for imaging, manipulation, and force measurement. Atomic Force Microscopy was first developed in 1986 ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Topgraphy and frequency shift images of the ITP radical in constant-current mode. Courtesy : D Ebeling Ten years ago, researchers succeeded in significantly increasing the lateral resolution of low ...

In this interview, AZoNano talks to Eduard Weichselbaumer, Senior Executive at PrimeNano, about the work they do in the Atomic Force Microscopy Field and the advances the company is making. Please ...

Michigan Tech’s new Scanning Transmission Electron Microscope lets researchers zoom in to understand the big picture at the atomic scale. Housed in a specially constructed brick building at the south ...

The MFP-3D AFM is capable of high-resolution imaging and force measurements on a wide variety of materials, both in air and under liquid.

An atomic force microscope can be used as a single-electron current meter, according to new experiments by researchers at IBM. The technique, which measures the energy levels of single molecules on ...

Doing it yourself may not get you the most precise lab equipment in the world, but it gets you a hands-on appreciation of the techniques that just can’t be beat. Today’s example of this adage: [Stoppi ...

Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...

Bacteriophages or “phages” is the terms used for viruses that infect bacteria. The UAB researchers, led by Terje Dokland, Ph.D., in collaboration with Asma Hatoum-Aslan, Ph.D., at the University of ...