What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Atomic force microscopy (AFM) has established itself as a decisive tool for probing nanoscale interactions, particularly adhesion forces and capillary phenomena. A precise understanding of these ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

A major advantage of atomic force microscopes (AFMs) is their versatility in integrating various operational modes that assess different material properties and functionalities. Among the most ...